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Bias enhanced diamond nucleation onto 3C–SiC(100) surfaces studied by high resolution X-ray photoelectron and high resolution electron energy loss spectroscopies

✍ Scribed by Arnault, J.-C.; Saada, S.; Michaelson, Sh.; Hangaly, N.K.; Akhvlediani, R.; Hoffman, A.

Book ID: 123098795
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 805 KB
Volume: 17
Category: Article
ISSN: 0925-9635
DOI: 10.1016/j.diamond.2008.01.032

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