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Bias circuit effects on the current‐voltage characteristic of double‐barrier tunneling structures: Experimental and theoretical results

✍ Scribed by Belhadj, C. Y.; Martin, K. P.; Ben Amor, S.; Rascol, J. J. L.; Higgins, R. J.; Potter, R. C.; Hier, H.; Hempfling, E.


Book ID
118051067
Publisher
American Institute of Physics
Year
1990
Tongue
English
Weight
665 KB
Volume
57
Category
Article
ISSN
0003-6951

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