Berkovich indentation-induced deformation behaviors of GaN thin films observed using cathodoluminescence and cross-sectional transmission electron microscopy

✍ Scribed by Sheng-Rui Jian

• Book ID: 108060572
• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 630 KB
• Volume: 254
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2008.04.078