Semiconducting behaviour in Bi60Sb40 all
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V Damodara Das; M.S. Jagadeesh
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Article
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1981
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Elsevier Science
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English
β 225 KB
Electrical resistance measurements of annealed Bi6o Sb4o alloy thin films of various thicknesses vacuum deposited at different substrate temperatures have been carried out from about 80 K to 500 K. The observed variation in resistance with temperature has been explained on the basis of impurity cond