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Behavioral Models of IC Output Buffers From on-the-Fly Measurements

โœ Scribed by Stievano, I.S.; Maio, I.A.; Canavero, F.G.


Book ID
114630840
Publisher
IEEE
Year
2008
Tongue
English
Weight
274 KB
Volume
57
Category
Article
ISSN
0018-9456

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๐Ÿ“œ SIMILAR VOLUMES


Impact of the variable output resistance
โœ Gregorio Cappuccino; Felice Crupi; Andrea Pugliese ๐Ÿ“‚ Article ๐Ÿ“… 2007 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 293 KB

## Abstract The work focuses on the impact of the finite and variable MOSFET output resistance on the transient response LC transmission line drivers. Experimental results highlight the severe error occurring in conventional timing analysis when actual finite resistance of the device is neglected.