Beam tests of ATLAS SCT silicon strip detector modules
✍ Scribed by F. Campabadal; C. Fleta; M. Key; M. Lozano; C. Martinez; G. Pellegrini; J.M. Rafi; M. Ullan; L. Johansen; B. Pommeresche; B. Stugu; A. Ciocio; V. Fadeyev; M. Gilchriese; C. Haber; J. Siegrist; H. Spieler; C. Vu; P.J. Bell; D.G. Charlton; J.D. Dowell; B.J. Gallop; R.J. Homer; P. Jovanovic; G. Mahout; T.J. McMahon; J.A. Wilson; A.J. Barr; J.R. Carter; B.P. Fromant; M.J. Goodrick; J.C. Hill; C.G. Lester; M.J. Palmer; M.A. Parker; D. Robinson; A. Sabetfakhri; R.J. Shaw; F. Anghinolfi; E. Chesi; S. Chouridou; R. Fortin; J. Grosse-Knetter; M. Gruwe; P. Ferrari; P. Jarron; J. Kaplon; A. Macpherson; T. Niinikoski; H. Pernegger; S. Roe; A. Rudge; G. Ruggiero; R. Wallny; P. Weilhammer; W. Bialas; W. Dabrowski; P. Grybos; S. Koperny; J. Blocki; P. Bruckman; S. Gadomski; J. Godlewski; E. Gornicki; P. Malecki; A. Moszczynski; E. Stanecka; M. Stodulski; R. Szczygiel; M. Turala; M. Wolter; A. Ahmad; J. Benes; C. Carpentieri; L. Feld; C. Ketterer; J. Ludwig; J. Meinhardt; K. Runge; B. Mikulec; M. Mangin-Brinet; M. D’Onofrio; M. Donega; S. Moêd; A. Sfyrla; D. Ferrere; A.G. Clark; E. Perrin; M. Weber; R.L. Bates; A. Cheplakov; D.H. Saxon; V. O’Shea; K.M. Smith; Y. Iwata; T. Ohsugi; T. Kohriki; T. Kondo; S. Terada; N. Ujiie; Y. Ikegami; Y. Unno; R. Takashima; T. Brodbeck; A. Chilingarov; G. Hughes; P. Ratoff; T. Sloan; P.P. Allport; G.-L. Casse; A. Greenall; J.N. Jackson; T.J. Jones; B.T. King; S.J. Maxfield; N.A. Smith; P. Sutcliffe; J. Vossebeld; G.A. Beck; A.A. Carter; S.L. Lloyd; A.J. Martin; J. Morris; J. Morin; K. Nagai; T.W. Pritchard; B.E. Anderson; J.M. Butterworth; T.J. Fraser; T.W. Jones; J.B. Lane; M. Postranecky; M.R.M. Warren; V. Cindro; G. Kramberger; I. Mandić; M. Mikuž; I.P. Duerdoth; J. Freestone; J.M. Foster; M. Ibbotson; F.K. Loebinger; J. Pater; S.W. Snow; R.J. Thompson; T.M. Atkinson; G. Bright; S. Kazi; S. Lindsay; G.F. Moorhead; G.N. Taylor; G. Bachindgagyan; N. Baranova; D. Karmanov; M. Merkine; L. Andricek; S. Bethke; J. Kudlaty; G. Lutz; H.-G. Moser; R. Nisi
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 510 KB
- Volume
- 538
- Category
- Article
- ISSN
- 0168-9002
No coin nor oath required. For personal study only.
📜 SIMILAR VOLUMES
Based on simulated LHC beam loss scenarios, fully depleted CMS silicon tracker modules and sensors were exposed to 42 ns-long beam spills of approximately 10 11 protons per spill at the PS at CERN. The ionisation dose was sufficient to short circuit the silicon sensors. The dynamic behaviour of bias