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Beam-test of CMOS pixel sensors with 6 GeV electrons

✍ Scribed by D. Contarato; M. Adamus; J. Ciborowski; E. Fretwurst; T. Haas; J. Hauschildt; R. Klanner; U. Kötz; B. Löhr; C. Muhl; A. Polini; J. Sztuk; A. Tyszkiewicz; W. Zeuner

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 276 KB
Volume: 565
Category: Article
ISSN: 0168-9002
DOI: 10.1016/j.nima.2006.04.068

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Beam-test of CMOS pixel sensors with 6&#xa0;GeV electrons

Beam-test of CMOS pixel sensors with 6 GeV electrons