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In-beam tests of the AMS RICH prototype with 20 A GeV/c secondary ions

✍ Scribed by B Baret; P Aguayo; M Aguilar Benitez; L Arruda; F Barao; A Barrau; E Belmont; J Berdugo; G Boudoul; J Borges; M Buénerd; D Casadei; J Casaus; C Delgado; C Diaz; L Derome; L Eraud; L Gallin-Martel; F Giovacchini; P Goncalves; E Lanciotti; G Laurenti; A Malinine; C Mana; J Marin; G Martinez; A Menchaca-Rocha; C Palomares; M Pimenta; K Protasov; E Sanchez; E-S Seo; I Sevilla; A Torrento; M Vargas-Trevino

Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 524 KB
Volume: 525
Category: Article
ISSN: 0168-9002
DOI: 10.1016/j.nima.2004.03.032

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