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Bayesian analysis of within-field variability of corn yield using a spatial hierarchical model

โœ Scribed by Pingping Jiang; Zhuoqiong He; Newell R. Kitchen; Kenneth A. Sudduth


Publisher
Springer US
Year
2008
Tongue
English
Weight
929 KB
Volume
10
Category
Article
ISSN
1385-2256

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