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Determining the Causes of Spatial and Temporal Variability of Wheat Yields at Sub-field Scale Using a New Method of Upscaling a Crop Model

✍ Scribed by M. T. F. Wong; S. Asseng


Publisher
Springer
Year
2006
Tongue
English
Weight
406 KB
Volume
283
Category
Article
ISSN
0032-079X

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