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Barrier characteristics of PtSip-Si Schottky diodes as determined from I-V-T measurements

✍ Scribed by P.G. McCafferty; A. Sellai; P. Dawson; H. Elabd

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 890 KB
Volume: 39
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(95)00162-x

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