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Barrier and electrode properties of high Tc Josephson junctions formed by a plasma discharge process

โœ Scribed by E. Aharoni; G. Koren; E. Polturak; D. Cohen


Book ID
103946973
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
328 KB
Volume
209
Category
Article
ISSN
0921-4534

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โœฆ Synopsis


The influence of rf discharge in CF4 and O~ gases on the properties of thin YBCO films and edge junctions was investigated by transport ,neasurements and Auger spectroscopy. It was found that oxygen plasma of short duration can serve as a cleaning step before tile formation of the barrier. In contrast, CF4 plasma tends to substitute oxygen in the superconducting film by fluorine which yield an insulating layer. A CF4 plasma discharge of more than one minute turns the YBCO film irreversibly into an insulator. At shorter durations, tile deterioration of the films is limited to a thickness of the order of few tens of angstroms.


๐Ÿ“œ SIMILAR VOLUMES


Barriers formed by a plasma discharge pr
โœ E. Aharoni; G. Koren ๐Ÿ“‚ Article ๐Ÿ“… 1994 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 145 KB

All YBCO Josephson edge junctions were prepared with a barrier formed by an rf plasma discharge under different conditions. The structure of the barrier and the transport properties of these junctions, have been investigated. Under typical plasma conditions of 30-60 s plasma of 50-80 W at 100 mTorr