Surface microanalysis by reflection elec
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Wang, Z. L.
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Article
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1990
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Wiley (John Wiley & Sons)
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English
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Several basic physical concepts of applying eq. Ik = 1oN"t to surface microanalysis by reflection electron energy-loss spectroscopy (REELS) are clarified. Here Ik and I are the integrated intensities of the core ionization edge and the low loss part, u is the scattering cross section of element x wi