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Background subtraction in electron spectroscopy by use of reflection electron energy loss spectra

โœ Scribed by I. Chorkendorff; S. Tougaard


Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
689 KB
Volume
29
Category
Article
ISSN
0169-4332

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Surface microanalysis by reflection elec
โœ Wang, Z. L. ๐Ÿ“‚ Article ๐Ÿ“… 1990 ๐Ÿ› Wiley (John Wiley & Sons) ๐ŸŒ English โš– 668 KB

Several basic physical concepts of applying eq. Ik = 1oN"t to surface microanalysis by reflection electron energy-loss spectroscopy (REELS) are clarified. Here Ik and I are the integrated intensities of the core ionization edge and the low loss part, u is the scattering cross section of element x wi