Automatic material characterization at microwave frequencies
โ Scribed by Watters, D.G.; Brodwin, M.E.
- Book ID
- 114543774
- Publisher
- IEEE
- Year
- 1988
- Tongue
- English
- Weight
- 413 KB
- Volume
- 37
- Category
- Article
- ISSN
- 0018-9456
- DOI
- 10.1109/19.6067
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๐ SIMILAR VOLUMES
A systematic procedure for the characterization of complex bump configurations at RF and microwave frequencies, is presented. Beginning with simple arrangements-single-and two-coupled bumps-full-wave electromagnetic (EM) field analysis, circuit simulations and RF measurements were used for the devel
## Abstract Macroporous silicon layers with randomly distributed vertical cylindrical pores of average diameter 120 nm were fabricated on selected areas on a p^+^ (resistivity 5 mฮฉcm) silicon substrate by anodization in HF~x~ethanol solution. The thickness of the layers was 50 ฮผm and they are inten