Automatic detection and high resolution
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J. Bauch; F. Henschel; M. Schulze
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Article
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2011
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John Wiley and Sons
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English
⚖ 241 KB
👁 1 views
## Abstract The presented method demonstrates a first step in the development of a high resolution “Residual stress microscope” and facilitates through the implementation of largely automated procedures a fast detection of diffraction lines in the form of conic sections. It has been implemented for