𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Automated system for the characterization of high resistivity semiconductors by the van der Pauw method

✍ Scribed by Forbes, L.

Book ID
120071759
Publisher
American Institute of Physics
Year
1981
Tongue
English
Weight
888 KB
Volume
52
Category
Article
ISSN
0034-6748

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

The Van der Pauw method for sheet resist
The Van der Pauw method for sheet resistance measurements of polypyrrole-coated para-aramide woven fabrics
✍ J. Banaszczyk; A. Schwarz; G. De Mey; L. Van Langenhove πŸ“‚ Article πŸ“… 2010 πŸ› John Wiley and Sons 🌐 English βš– 888 KB

## Abstract In this article, it is shown that the Van der Pauw (VDP) method, generally known in microelectronics, can be successfully adapted to sheet resistance measurements of electroconductive fabrics. We prepared two polypyrrole‐coated woven para‐aramide fabrics and used a simple setup to measu