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Automated shock in particle impact noise (PIN) testing : L. A. Schreier. Proc. Electron. Components Conf. Arlington, Va., May 16–18. 1977. p. 169

Publisher: Elsevier Science
Year: 1977
Tongue: English
Weight: 123 KB
Volume: 16
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(77)90561-3

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