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Autocorrelation measurements of CdSxSe1-x thin film noise

✍ Scribed by V. Filiač; Z. Hájek; Ch. Kleint

Publisher: Elsevier Science
Year: 1984
Tongue: English
Weight: 432 KB
Volume: 27
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(84)90089-3

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