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Auger recombination in silicon nanocrystals embedded in SiO2wide band-gap lattice

✍ Scribed by Mahdouani, M. ;Bourguiga, R. ;Jaziri, S. ;Gardelis, S. ;Nassiopoulou, A. G.


Publisher
John Wiley and Sons
Year
2008
Tongue
English
Weight
410 KB
Volume
205
Category
Article
ISSN
0031-8965

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✦ Synopsis


Abstract

We calculate the ground and excited electron and hole levels in spherical Si nanocrystals (quantum dots) embedded within SiO~2~ in a multiband effective mass approximation. The obtained energies of electron and hole are used to estimate the Auger Recombination (AR) lifetime in Si Nanocrystals (NCs). The excited electron, excited hole and biexciton AR types are considered. (Β© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)


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