Auger recombination-enhanced hot carrier degradation in nMOSFETs with a forward substrate bias

✍ Scribed by Tsai, C.-W.; Chen, M.-C.; Ku, S.-H.; Tahui Wang

• Book ID: 114617061
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 333 KB
• Volume: 50
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2003.812484