✦ LIBER ✦
Degradation Induced by X-Ray Irradiation and Channel Hot Carrier Stresses in 130-nm NMOSFETs With Enclosed Layout
✍ Scribed by Silvestri, M.; Gerardin, S.; Paccagnella, A.; Faccio, F.
- Book ID
- 127038345
- Publisher
- IEEE
- Year
- 2008
- Tongue
- English
- Weight
- 625 KB
- Volume
- 55
- Category
- Article
- ISSN
- 0018-9499
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