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Auger depth profile analysis and EFTEM analysis of annealed Ti/Al-contacts on Si-doped GaN

✍ Scribed by Markus Pidun; Peter Karduck; Joachim Mayer; Klaus Heime; Bernd Schineller; Thomas Walther

Book ID: 108417468
Publisher: Elsevier Science
Year: 2001
Tongue: English
Weight: 499 KB
Volume: 179
Category: Article
ISSN: 0169-4332
DOI: 10.1016/s0169-4332(01)00282-3

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