𝔖 Bobbio Scriptorium
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Auger and electron energy loss studies on liquid surfaces

✍ Scribed by R.E. Ballard; Jimmy Jones; Derek Read; Andrew Inchley; Martin Cranmer


Book ID
107733086
Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
259 KB
Volume
147
Category
Article
ISSN
0009-2614

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The diagnostic potential of reΓ‘ected electron energy-loss microscopy (REELM) and scanning Auger microscopy (SAM) are explored with respect to two particular aspects encountered in the surface microchemical analysis of semiconductor materials : determining the kind of coverage, i.e. whether continuou