An electrochemical AFM study on electrod
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M. Koinuma; K. Uosaki
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Article
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1995
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Elsevier Science
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English
โ 756 KB
## In situ atomic force microscopy (AFM) was used to observe the surface structure change during electrodeposition of Cu on p-GaAs(100) surface in HCI solution. How the electrodeposition of Cu proceeded was strongly dependent on the structure of the substrate. In the portion where the surface was