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Atomic-Scale Characterization of II–VI Compound Semiconductors

✍ Scribed by David J. Smith


Book ID
126362938
Publisher
Springer US
Year
2013
Tongue
English
Weight
699 KB
Volume
42
Category
Article
ISSN
0361-5235

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A concise discussion concerning the UHV ALE growth of ternary II-VI compounds is presented in this paper. Simultaneous reflection mass spectrometry (REMS) and reflection high energy electron diffraction (RHEED) measurements of the surface kinetic and structural parameters, respectively, governing th