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Atomic resolution with an atomic force microscope using piezoresistive detection

✍ Scribed by Tortonese, M.; Barrett, R. C.; Quate, C. F.

Book ID: 120278665
Publisher: American Institute of Physics
Year: 1993
Tongue: English
Weight: 684 KB
Volume: 62
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.108593

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