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Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7

✍ Scribed by R. Lüthi; E. Meyer; M. Bammerlin; A. Baratoff; T. Lehmann; L. Howald; C. Gerber; H.-J. Güntherodt


Publisher
Springer
Year
1996
Tongue
English
Weight
282 KB
Volume
100
Category
Article
ISSN
1434-6036

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