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Atomic force microscopy using optical pickup head to measure cantilever displacement

โœ Scribed by Sang-Heon Lee; Hyun-Chul Kim; Kwang-Suk Jung


Book ID
107662399
Publisher
Korean Society for Precision Engineering
Year
2011
Tongue
English
Weight
350 KB
Volume
12
Category
Article
ISSN
1229-8557

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