Nanoscale Investigation of Optical and Electrical Properties by Dynamic-Mode Atomic Force Microscopy Using a Piezoelectric Cantilever

✍ Scribed by Satoh, Nobuo; Kobayashi, Kei; Watanabe, Shunji; Fujii, Toru; Horiuchi, Toshihisa; Yamada, Hirofumi; Matsushige, Kazumi

• Book ID: 124073538
• Publisher: Institute of Pure and Applied Physics
• Year: 2003
• Tongue: English
• Weight: 190 KB
• Volume: 42
• Category: Article
• ISSN: 0021-4922
• DOI: 10.1143/JJAP.42.4878