Atomic Force Microscopy in Process Engineering An Introduction to AFM for Improved Processes and Pro
✍ Scribed by W. Richard Bowen, Nidal Hilal
- Publisher
- Butterworth-Heinemann
- Year
- 2009
- Tongue
- English
- Leaves
- 290
- Category
- Library
No coin nor oath required. For personal study only.
✦ Synopsis
This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practising engineers as well as to those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM.
The book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. Fundamentals and techniques are concisely described, while specific benefits for process engineering are clearly defined and illustrated. Key content includes: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the development of fouling resistant membranes; nanoscale pharmaceutical analysis; nanoengineering for cellular sensing; polymers on surfaces; micro and nanoscale rheometry.
- Atomic force microscopy (AFM) is an important tool for process engineers and scientists as it enables improved processes and products
- The only book dealing with the theory and practical applications of atomic force microscopy in process engineering
- Provides best-practice guidance and experience on using AFM for process and product improvement
✦ Table of Contents
Cover Page
......Page 1
Copyright Page
......Page 2
Preface
......Page 3
About the Editors......Page 7
List of Contributors......Page 9
Basic Principles of Atomic Force Microscopy......Page 11
Introduction......Page 12
The atomic force microscope......Page 13
Cantilevers and probes......Page 16
Effect of Probe Geometry......Page 17
Imaging modes......Page 18
Contact Mode Imaging......Page 19
Non-Contact Mode......Page 20
Force Volume Imaging......Page 21
The AFM as a force sensor......Page 22
Calibration of Normal Spring Constants......Page 26
Calibration of Torsional and Lateral Spring Constants......Page 31
Colloid probes......Page 32
Abbreviations and Symbols......Page 33
References
......Page 34
Measurement of Particle and Surface Interactions Using Force Microscopy......Page 41
Colloid Probes......Page 42
van der Waals Forces......Page 45
Electrical Double Layer Forces......Page 54
DLVO T heory......Page 63
Solvation Forces......Page 68
Steric Interaction Forces......Page 72
Hydrophobic Interaction Forces......Page 73
Effect of Hydrodynamic Drag on AFM Force Measurements......Page 76
Contact Mechanics and Adhesion......Page 77
Abbreviations and Symbols......Page 80
Greek symbols......Page 83
References......Page 84
Quantification of Particle–Bubble Interactions Using Atomic Force Microscopy......Page 91
Particle–bubble interactions......Page 92
Determination of particle–bubble separation......Page 96
Determination of contact angle from force–distance curves......Page 98
Effect of Particle Surface Chemistry on Particle–Bubble Interactions......Page 101
Effect of Surfactant on Particle–Bubble Interactions......Page 104
Effect of loading force on particle–bubble interactions......Page 107
Effect of hydrodynamics on particle–bubble interactions......Page 108
Conclusions......Page 110
List of symbols......Page 111
References......Page 112
Investigating Membranes and Membrane Processes with Atomic Force Microscopy......Page 116
Introduction......Page 117
The range of possibilities for investigating membranes......Page 118
Correspondence between surface pore dimensions from AFM and MWCO......Page 122
Imaging in liquid and the determination of surface electrical properties......Page 125
Effects of surface roughness on interactions with particles......Page 129
‘Visualisation’ of the rejection of a colloid by a membrane pore and critical flux......Page 132
The use of AFM in membrane development......Page 133
Characterisation of metal surfaces......Page 135
Effect of Electropolishing of Steel Surfaces......Page 139
Corrosion of Metal Surfaces......Page 141
Conclusions......Page 144
References
......Page 145
Introduction ......Page 148
Measurement of adhesion of colloidal particles and cells to membrane surfaces ......Page 150
Modification of Membranes with Quaternary Ammonium Salts......Page 153
Membrane Characterisation......Page 154
(Bio)Adhesion Forces between a BSA-Functionalised Colloid Probe and Membrane Surface......Page 160
Modification of membranes with sulphonated poly (ether-ether ketone) polymers......Page 172
Acknowledgements ......Page 177
References......Page 178
Introduction......Page 181
The AFM as a force measurement tool in pharmaceuticals......Page 182
Particle Interaction Measurements......Page 183
Mechanical Properties from Single-particle Measurements......Page 187
AFM imaging-based studies......Page 191
Micro- and nanothermal characterisation with SPM......Page 193
Abbreviations and Symbols......Page 198
References......Page 199
Introduction......Page 203
How Do Cells Respond to the ECM?......Page 204
Engineering the ECM for probing cell sensing......Page 206
Surface Patterning (Chemical Signals)......Page 207
Nanotopography......Page 213
Nanoscale Measurement: Challenges and Opportunities for AFM......Page 217
AFM Imaging of Cells......Page 219
Elasticity Measurement of Living Cells......Page 222
Conclusions......Page 225
Abbreviations and Symbols......Page 227
References......Page 228
Introduction......Page 233
Basic concepts......Page 235
End-grafted polymer chains......Page 237
Diblock copolymers adsorbed on surfaces......Page 244
Star-shaped polymers adsorbed on surfaces......Page 245
Conclusions......Page 248
Acknowledgements......Page 249
References......Page 250
Introduction......Page 253
Dynamic AFM methods for the characterisation of material properties......Page 257
Dynamic modulation studies on confined fluids......Page 260
Determination of rheological properties from resonance spectra......Page 264
Cavitation and adhesive failure of thin films......Page 267
Mesoscale experimental studies of the tensile behaviour of thin fluid films......Page 269
List of Symbols......Page 277
References......Page 278
Future Prospects......Page 283
E
......Page 288
N
......Page 289
Z
......Page 290
✦ Subjects
Физика;Практикумы, экспериментальная физика и физические методы исследования;
📜 SIMILAR VOLUMES
<p>This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practising engineers as well as to those who are improving their AFM skills and knowledge, and to researchers who are developi
<span>Find out why many businesses preferentially hire Six Sigma trained candidates. AN INTRODUCTION TO SIX SIGMA AND PROCESS IMPROVEMENT, 2e shows you the essence and basics of Six Sigma, as well as how Six Sigma has brought a renewed interest in the principles of total quality to cutting-edge busi
A field bus is a two-way link between a programmable controller or operations monitor and an industrial device like a sensor, an electric motor, or a switch. It is a critical part of any automated industrial process - whether for factory automation (discrete processes like an assembly line) or proce
<p>This book introduces the basic concepts of signal processing for scientists and students with no engineering background. The book presents the concepts with minimum use of mathematical formulations and more emphasis on visual illustrations. The idea is to present an intuitive approach to understa
This book is intended for under graduate as well as post graduate students of chemical, electrical, electronics and instrumentation branches of engineering disciplines pursuing process control as a subject and will be useful to research students of similar disciplines. This book focuses on the bas