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Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation

✍ Scribed by Klapetek, Petr ;Ohl�dal, Ivan ;Navr�til, Karel

Book ID
106196368
Publisher
Springer-Verlag
Year
2004
Weight
186 KB
Volume
147
Category
Article
ISSN
0344-838X

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