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Physical evaluation of pure zein films by atomic force microscopy and thermal mechanical analysis

✍ Scribed by Tomoyuki Yoshino; Seiichiro Isobe; Takaaki Maekawa

Book ID: 107489945
Publisher: Springer-Verlag
Year: 2000
Tongue: English
Weight: 666 KB
Volume: 77
Category: Article
ISSN: 0003-021X
DOI: 10.1007/s11746-000-0112-7

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