✦ LIBER ✦

Atomic force microscopy analysis of morphology of thin pentacene films deposited on parylene-C and benzocyclobutene

✍ Scribed by Iazykov, Maksym; Erouel, Mohsen; Tardy, Jacques; Skryshevsky, Valeriy A.; Phaner-Goutorbe, Magali

Book ID: 118023547
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 862 KB
Volume: 607
Category: Article
ISSN: 0039-6028
DOI: 10.1016/j.susc.2012.09.001

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Atomic force microscopy surface morpholo

Atomic force microscopy surface morphology studies of ‘in situ’ deposited polyaniline thin films

✍ Jamshid K. Avlyanov; Jack Y. Josefowicz; Alan G. MacDiarmid 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 418 KB

Investigation of surface morphology of B

Investigation of surface morphology of BaTiO3 thin films by atomic force microscopy

✍ Ma, Kun ;Zhang, Jie ;Liu, Junzheng ;Cui, Dafu ;Chen, Zhenghao ;Zhou, Yueliang ;L 📂 Article 📅 1995 🏛 John Wiley and Sons 🌐 English ⚖ 283 KB

Morphology of thin lead films grown on g

Morphology of thin lead films grown on glass substrates by atomic force and electron microscopy

✍ S Bhaumik; S Kundu; S.P SenGupta 📂 Article 📅 2001 🏛 Elsevier Science 🌐 English ⚖ 591 KB

Surface morphology of metal films deposi

Surface morphology of metal films deposited on mica at various temperatures observed by atomic force microscopy

✍ Morihide Higo; Katsuya Fujita; Yuya Tanaka; Masaru Mitsushio; Toshifumi Yoshidom 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 831 KB

Atomic force microscopy analysis of buck

Atomic force microscopy analysis of buckling phenomena in metallic thin films on substrates

✍ V. Branger; Ch. Coupeau; Ph. Goudeau; B. Boubeker; K. F. Badawi; J. Grilhé 📂 Article 📅 2000 🏛 Springer 🌐 English ⚖ 241 KB

Nanomeasurement and fractal analysis of

Nanomeasurement and fractal analysis of PZT ferroelectric thin films by atomic force microscopy

✍ Yeau-Ren Jeng; Ping-Chi Tsai; Te-Hua Fang 📂 Article 📅 2003 🏛 Elsevier Science 🌐 English ⚖ 280 KB

In this study, the radio frequency (RF) magnetron sputtering process is used to generate a PZT ferroelectric thin film on a silicon substrate. The surface characteristics of this lead zirconate titanate film Pb(Zr Ti )O is then investigated by means of an atomic force microscopy (AFM) method. The r