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Atomic Force Microscopy: A Versatile Tool for Studying Cell Morphology, Adhesion and Mechanics

✍ Scribed by C. M. Franz; P.-H. Puech

Book ID
107620647
Publisher
Springer
Year
2008
Tongue
English
Weight
577 KB
Volume
1
Category
Article
ISSN
1865-5025

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The phenomenal success of atomic force microscopy (AFM) in industry is based on the easy access of samples with practical interest due to the high resolution and high contrast of the method under controllable ambient conditions. In our case, the high resolution of AFM is mainly used in the mesoscale