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Atomic Force Microscope Based Kelvin Probe Measurements: Application to an Electrochemical Reaction

✍ Scribed by Böhmisch, M.; Burmeister, F.; Rettenberger, A.; Zimmermann, J.; Boneberg, J.; Leiderer, P.

Book ID
111696152
Publisher
American Chemical Society
Year
1997
Tongue
English
Weight
767 KB
Volume
101
Category
Article
ISSN
0022-3654

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potentials, cells, elements (inorganic) F 3000 ## 12 -012 Atomic Force Microscope (AFM) Based Kelvin Probe Measurements: Application to an Electrochemical Reaction. -The title method is used to determine work functions of metals and semiconductors quantitatively with respect to the energetics of