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Atomic force and confocal microscopy for the study of cortical cells cultured on silicon wafers

✍ Scribed by J. Ma; F. Z. Cui; B. F. Liu; Q. Y. Xu

Publisher: Springer
Year: 2007
Tongue: English
Weight: 343 KB
Volume: 18
Category: Article
ISSN: 0957-4530
DOI: 10.1007/s10856-006-0071-4

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