In this paper, we study the global behavior of the time-dependent drift-diffusion model for semiconductor devices. Under certain assumptions on the mobilities, we first prove the existence of the global weak solutions with uniform \(L^{*}\) bounds. Then we show that the system, when considered as a
Asymptotic Behavior of the Drift-Diffusion Semiconductor Equations
β Scribed by W.F. Fang; K. Ito
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 582 KB
- Volume
- 123
- Category
- Article
- ISSN
- 0022-0396
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β¦ Synopsis
In this paper, we continue our study on the asymptotic behavior of the drift-diffusion model for semiconductor devices. We assume the mobilities are constants, and show in this case the dynamical system has a compact, connected, maximal attractor that attracts sets that are bounded in terms of the (L^{x_{2}}) norm. We then prove the differentiability of the semigroup defined by the solution map, and give an upper bound for the Hausdorff dimension of the attractor. (f) 1995 Academic Press. Inc.
π SIMILAR VOLUMES
A number of transient and steady-state finite element formulations of the semiconductor drift-diffusion equations are studied and compared with respect to their accuracy and efficiency on a simple test structure (the Mock diode). A new formulation, with a consistent interpolation function used to re