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Asymmetric X-ray Bragg reflexion and shallow strain distribution in silicon single crystals

✍ Scribed by Fukuhara, A. ;Takano, Y.

Book ID
114498703
Publisher
International Union of Crystallography
Year
1977
Tongue
English
Weight
468 KB
Volume
10
Category
Article
ISSN
0021-8898

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## Abstract Synchrotron x‐ray radiation was used to study structural changes during deformation of a __single__ high‐modulus, high‐strength fiber of polyethylene (Spectra 1000, Allied Corp.) 20–40 ΞΌm in diameter. The high brightness of the synchrotron beam allowed x‐ray diffraction patterns to be o