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Assessment of techniques for characterizing the surface quality of ground silicon nitride

โœ Scribed by E. S. Zanoria; T. R. Watkins; K. Breder; L. Riester; M. Bashkansky; J. Reintjes; J. G. Sun; W. A. Ellingson; P. J. Blau


Book ID
111786616
Publisher
Springer US
Year
1998
Tongue
English
Weight
502 KB
Volume
7
Category
Article
ISSN
1059-9495

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