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Assessment of structure variation in silicon nanowire FETs and impact on SRAM

โœ Scribed by Yi-Bo Liao; Meng-Hsueh Chiang; Keunwoo Kim; Wei-Chou Hsu


Book ID
113798402
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
612 KB
Volume
43
Category
Article
ISSN
0026-2692

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