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[ASME ASME 2011 International Mechanical Engineering Congress and Exposition - Denver, Colorado, USA (November 11–17, 2011)] Volume 11: Nano and Micro Materials, Devices and Systems; Microsystems Integration - Thermal Conductivity Measurement of Thin Nanowires

✍ Scribed by Wingert, Matthew C.; Moon, Jaeyun; Chen, Zack; Xiang, Jie; Chen, Renkun


Book ID
125443088
Publisher
ASMEDC
Year
2011
Weight
456 KB
Category
Article
ISBN
0791854973

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