Area-Efficient ESD-Transient Detection Circuit With Smaller Capacitance for On-Chip Power-Rail ESD Protection in CMOS ICs

✍ Scribed by Shih-Hung Chen; Ming-Dou Ker

• Book ID: 115510267
• Publisher: Institute of Electrical and Electronics Engineers
• Year: 2009
• Tongue: English
• Weight: 680 KB
• Volume: 56
• Category: Article
• ISSN: 1549-7747
• DOI: 10.1109/tcsii.2009.2019164