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Ar ion implantation induced electrical and structural changes in epitaxial YBa2Cu3O7-x thin films

✍ Scribed by Yijie Li; Guangchen Xiong; Zizhao Gan


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
689 KB
Volume
199
Category
Article
ISSN
0921-4534

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Critical current density and flux creep
✍ G.C. Xiong; F.R. Wang; S.Z. Wang; Q.D. Jiang; J.Y. Li; Z.J. Yin; C.Y. Li; D.L. Y πŸ“‚ Article πŸ“… 1990 πŸ› Elsevier Science 🌐 English βš– 231 KB

The superconducting transition and critical current density were studied for epitaxial YBa2Cu307\_x thin films as a function of temperature, magnetic field and electric voltage gradient. A linear section of the curve of the logarithm of apparent voltage versus transport current density, In(E)-J, was