<p>The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two β the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scop
Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques
β Scribed by Bharat Bhushan, Harald Fuchs (auth.)
- Publisher
- Springer-Verlag Berlin Heidelberg
- Year
- 2009
- Tongue
- English
- Leaves
- 280
- Series
- NanoScience and Technology
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
β¦ Synopsis
From the reviews:
"Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. β¦ The editors and their talented authors have been among the leaders in the study of probe methods. β¦ Each chapter captures both the excitement and the importance of the work and conclusions reported, and will make profitable reading for researchers at all experience levels. β¦ All the chapters are supported by extensive lists of references and beautifully illustrated and in color too, also along with graphs, equations etc." (Current Engineering Practice, 2009)
βThe articles β¦ are written in sufficient detail, so that university students, researchers and engineers can understand the physics of the instruments, the design and construction of the devices and the cantilevers, the signal processing algorithms, and their use in imaging and the surface characterization of the specimens. β¦ SPM includes a variety of techniques, including scanning near-field optical microscopy, which has interesting applications β¦ . well-written and clearly illustrated. β¦ contain ample experimental data and significant discussion of limitations and artifacts.β (Barry R. Masters, Optics & Photonics News, September, 2009)β¦ Table of Contents
Front Matter....Pages I-LVI
Oscillation Control in Dynamic SPM with Quartz Sensors....Pages 1-16
Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation....Pages 17-38
Mechanical Diode-Based Ultrasonic Atomic Force Microscopies....Pages 39-71
Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science....Pages 73-95
Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements....Pages 97-138
AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip....Pages 139-164
Local Mechanical Properties by Atomic Force Microscopy Nanoindentations....Pages 165-198
Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction....Pages 199-229
Back Matter....Pages 231-235
β¦ Subjects
Nanotechnology; Surfaces and Interfaces, Thin Films; Polymer Sciences; Physical Chemistry; Solid State Physics and Spectroscopy
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