๐”– Scriptorium
โœฆ   LIBER   โœฆ

๐Ÿ“

Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques

โœ Scribed by Robert W. Stark, Martin Stark (auth.), Professor Bharat Bhushan, Professor Dr. Harald Fuchs (eds.)


Publisher
Springer-Verlag Berlin Heidelberg
Year
2006
Tongue
English
Leaves
455
Series
NanoScience and Technology
Edition
1
Category
Library

โฌ‡  Acquire This Volume

No coin nor oath required. For personal study only.

โœฆ Synopsis


The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two โ€“ the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.

โœฆ Table of Contents


Higher Harmonics in Dynamic Atomic Force Microscopy....Pages 1-36
Atomic Force Acoustic Microscopy....Pages 37-90
Scanning Ion Conductance Microscopy....Pages 91-119
Spin-Polarized Scanning Tunneling Microscopy....Pages 121-141
Dynamic Force Microscopy and Spectroscopy....Pages 143-164
Sensor Technology for Scanning Probe Microscopy and New Applications....Pages 165-203
Quantitative Nanomechanical Measurements in Biology....Pages 205-239
Scanning Microdeformation Microscopy: Subsurface Imaging and Measurement of Elastic Constants at Mesoscopic Scale....Pages 241-281
Electrostatic Force and Force Gradient Microscopy: Principles, Points of Interest and Application to Characterisation of Semiconductor Materials and Devices....Pages 283-320
Polarization-Modulation Techniques in Near-Field Optical Microscopy for Imaging of Polarization Anisotropy in Photonic Nanostructures....Pages 321-360
Focused Ion Beam as a Scanning Probe: Methods and Applications....Pages 361-412

โœฆ Subjects


Nanotechnology; Surfaces and Interfaces, Thin Films; Polymer Sciences; Physical Chemistry; Solid State Physics and Spectroscopy; Analytical Chemistry


๐Ÿ“œ SIMILAR VOLUMES


Applied Scanning Probe Methods V: Scanni
โœ Sadik Hafizovic, Kay-Uwe Kirstein, Andreas Hierlemann (auth.), Professor Bharat ๐Ÿ“‚ Library ๐Ÿ“… 2007 ๐Ÿ› Springer-Verlag Berlin Heidelberg ๐ŸŒ English

<p>The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. Iโ€“IV that a large number of technical and applicational asp

Applied Scanning Probe Methods XI: Scann
โœ Bharat Bhushan, Harald Fuchs (auth.) ๐Ÿ“‚ Library ๐Ÿ“… 2009 ๐Ÿ› Springer-Verlag Berlin Heidelberg ๐ŸŒ English

<p><P>From the reviews:</P><P>"Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. โ€ฆ The editors and their talented authors have been among the leaders in the study of probe methods. โ€ฆ Each chapter captures both the excitement and the importance of the w

Applied Scanning Probe Methods VIII: Sca
โœ Pietro Giuseppe Gucciardi, Guillaume Bachelier (auth.), Bharat Bhushan, Harald F ๐Ÿ“‚ Library ๐Ÿ“… 2008 ๐Ÿ› Springer-Verlag Berlin Heidelberg ๐ŸŒ English

<p>The success of the Springer Series Applied Scanning Probe Methods Iโ€“VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol.

Applied scanning probe methods 2. Scanni
โœ Bharat Bhushan, Harald Fuchs ๐Ÿ“‚ Library ๐ŸŒ English

<P>Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the lates

Applied Scanning Probe Methods II: Scann
โœ Bharat Bhushan, Harald Fuchs ๐Ÿ“‚ Library ๐Ÿ“… 2006 ๐Ÿ› Springer ๐ŸŒ English

Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest d