<p>The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. IโIV that a large number of technical and applicational asp
Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques
โ Scribed by Robert W. Stark, Martin Stark (auth.), Professor Bharat Bhushan, Professor Dr. Harald Fuchs (eds.)
- Publisher
- Springer-Verlag Berlin Heidelberg
- Year
- 2006
- Tongue
- English
- Leaves
- 455
- Series
- NanoScience and Technology
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
โฆ Synopsis
The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two โ the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.
โฆ Table of Contents
Higher Harmonics in Dynamic Atomic Force Microscopy....Pages 1-36
Atomic Force Acoustic Microscopy....Pages 37-90
Scanning Ion Conductance Microscopy....Pages 91-119
Spin-Polarized Scanning Tunneling Microscopy....Pages 121-141
Dynamic Force Microscopy and Spectroscopy....Pages 143-164
Sensor Technology for Scanning Probe Microscopy and New Applications....Pages 165-203
Quantitative Nanomechanical Measurements in Biology....Pages 205-239
Scanning Microdeformation Microscopy: Subsurface Imaging and Measurement of Elastic Constants at Mesoscopic Scale....Pages 241-281
Electrostatic Force and Force Gradient Microscopy: Principles, Points of Interest and Application to Characterisation of Semiconductor Materials and Devices....Pages 283-320
Polarization-Modulation Techniques in Near-Field Optical Microscopy for Imaging of Polarization Anisotropy in Photonic Nanostructures....Pages 321-360
Focused Ion Beam as a Scanning Probe: Methods and Applications....Pages 361-412
โฆ Subjects
Nanotechnology; Surfaces and Interfaces, Thin Films; Polymer Sciences; Physical Chemistry; Solid State Physics and Spectroscopy; Analytical Chemistry
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