Applied Scanning Probe Methods VI: Characterization
β Scribed by Thomas MΓΌller (auth.), Professor Bharat Bhushan, Satoshi Kawata (eds.)
- Publisher
- Springer-Verlag Berlin Heidelberg
- Year
- 2007
- Tongue
- English
- Leaves
- 371
- Series
- NanoScience and Technology
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
β¦ Synopsis
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. IβIV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. IβIV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.
β¦ Table of Contents
Front Matter....Pages I-XLV
Scanning Tunneling Microscopy of Physisorbed Monolayers: From Self-Assembly to Molecular Devices....Pages 1-30
Tunneling Electron Spectroscopy Towards Chemical Analysis of Single Molecules....Pages 31-63
STM Studies on Molecular Assembly at Solid/Liquid Interfaces....Pages 65-100
Single-Molecule Studies on Cells and Membranes Using the Atomic Force Microscope....Pages 101-125
Atomic Force Microscopy of DNA Structure and Interactions....Pages 127-164
Direct Detection of Ligand-Protein Interaction Using AFM....Pages 165-203
Dynamic Force Microscopy for Molecular-Scale Investigations of Organic Materials in Various Environments....Pages 205-245
Noncontact Atomic Force Microscopy....Pages 247-255
Tip-Enhanced Spectroscopy for Nano Investigation of Molecular Vibrations....Pages 257-285
Investigating Individual Carbon Nanotube/Polymer Interfaces with Scanning Probe Microscopy....Pages 287-323
Back Matter....Pages 325-338
β¦ Subjects
Nanotechnology; Surfaces and Interfaces, Thin Films; Polymer Sciences; Physical Chemistry; Solid State Physics and Spectroscopy
π SIMILAR VOLUMES
<p>The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two β the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- s
<p>Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is theref
<p>The success of the Springer Series Applied Scanning Probe Methods IβVII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol.
<P>Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the lates
<p><P>From the reviews:</P><P></P><P>"The editors have done a good job in making the various chapters quite readable and most of the chapters are well written on a level that will be accessible to most readers. β¦ As is usually the case with Springer books, these volumes have been beautifully printed