<p>The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. IβIV that a large number of technical and applicational asp
Applied Scanning Probe Methods VI: Characterization
β Scribed by Thomas MΓΌller (auth.), Professor Bharat Bhushan, Satoshi Kawata (eds.)
- Publisher
- Springer-Verlag Berlin Heidelberg
- Year
- 2007
- Tongue
- English
- Leaves
- 371
- Series
- NanoScience and Technology
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
β¦ Subjects
Nanotechnology; Surfaces and Interfaces, Thin Films; Polymer Sciences; Physical Chemistry; Solid State Physics and Spectroscopy
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