𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Applications of synchrotron X-rays in microelectronics industry research

✍ Scribed by Jean L. Jordan-Sweet; Christophe Detavernier; Christian Lavoie; Patricia M. Mooney; Michael F. Toney

Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
329 KB
Volume
241
Category
Article
ISSN
0168-583X

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

X-ray spectrometric applications of a sy
X-ray spectrometric applications of a synchrotron x-ray microbeam
✍ Atsuo Iida πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 371 KB πŸ‘ 2 views

Synchrotron x-ray microbeams with less than a few lm spatial resolution have been applied to x-ray spectroscopic and di †raction studies. Among various x-ray spectrometric applications, the relatively new techniques of nearsurface x-ray Γ‘uorescence analysis and the micro x-ray absorption Ðne structu

Fabrication of X-ray mirrors for synchro
Fabrication of X-ray mirrors for synchrotron applications
✍ H. Thiess; H. Lasser; F. Siewert πŸ“‚ Article πŸ“… 2010 πŸ› Elsevier Science 🌐 English βš– 662 KB

Application of conic section geometries play an important role for soft X-ray synchrotron beams. Mirror design for collimation or focusing under stringent boundary conditions may end up with very aspheric geometries. In particular, the aspheric departure of these surfaces from ''base geometries'' in

Applications of synchrotron radiation-in
Applications of synchrotron radiation-induced x-ray emission (SRIXE)
✍ K. W. Jones; W. J. Berry; D. J. Borsay; H. T. Cline; W. C. Conner Jr; C. S. Full πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 626 KB

Synchrotron radiation-induced x-ray emission (SRIXE) is now a proven analytical method for the determination of trace elements. It is notable for spatial resolutions of less than 10 lm and minimum detection limits that can be as low as 1 ppm by weight. The approach to SRIXE measurements in use at th