Surface temperature measurements are crucial in many applications; one promising approach is the use of thermographic phosphors. The temperatures of surfaces coated with such a material can easily be detected by measuring and evaluating the luminescence. In the present study, the CVD of chromium-dop
Applications of surface polaritons for detection and vibrational spectral analysis of thin films on metals and dielectrics
β Scribed by G.N. Zhizhin; M.A. Moskalova; E.A. Vinogradov; A.A. Sigarev; V.A. Yakovlev
- Publisher
- Elsevier Science
- Year
- 1983
- Tongue
- English
- Weight
- 416 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0368-2048
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
The crack onset strain (COS) of 4-level thin film transistor (TFT) devices on both steel foils and thin polyimide (PI) films was investigated using tensile experiments carried out in situ in an optical microscope. Cracks initiated first within the SiO 2 insulator layer for both types of substrates.
Vapor phase decomposition-droplet surface etching-graphite furnace atomic absorption spectroscopy (VPD-DSE-GFAAS) is discussed as a technique for the determination of low levels of metals in chemical oxides on silicon surfaces. The VPD-DSGGFAAS technique was found to be statistically equivalent to r