𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Applications of surface polaritons for detection and vibrational spectral analysis of thin films on metals and dielectrics

✍ Scribed by G.N. Zhizhin; M.A. Moskalova; E.A. Vinogradov; A.A. Sigarev; V.A. Yakovlev


Publisher
Elsevier Science
Year
1983
Tongue
English
Weight
416 KB
Volume
30
Category
Article
ISSN
0368-2048

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


CVD of Thin Ruby Films on Si(100) and St
✍ C. Pflitsch; D. Viefhaus; B. Atakan πŸ“‚ Article πŸ“… 2007 πŸ› John Wiley and Sons 🌐 English βš– 414 KB πŸ‘ 1 views

Surface temperature measurements are crucial in many applications; one promising approach is the use of thermographic phosphors. The temperatures of surfaces coated with such a material can easily be detected by measuring and evaluating the luminescence. In the present study, the CVD of chromium-dop

Mechanical failure analysis of thin film
✍ Y. Leterrier; A. Pinyol; D. GilliΓ©ron; J.-A. E. MΓ₯nson; P.H.M. Timmermans; P.C.P πŸ“‚ Article πŸ“… 2010 πŸ› Elsevier Science 🌐 English βš– 576 KB

The crack onset strain (COS) of 4-level thin film transistor (TFT) devices on both steel foils and thin polyimide (PI) films was investigated using tensile experiments carried out in situ in an optical microscope. Cracks initiated first within the SiO 2 insulator layer for both types of substrates.

Characterization and Application of the
✍ Hall, L. H.; Sees, J. A.; Schmidt, B. L. πŸ“‚ Article πŸ“… 1996 πŸ› John Wiley and Sons 🌐 English βš– 606 KB

Vapor phase decomposition-droplet surface etching-graphite furnace atomic absorption spectroscopy (VPD-DSE-GFAAS) is discussed as a technique for the determination of low levels of metals in chemical oxides on silicon surfaces. The VPD-DSGGFAAS technique was found to be statistically equivalent to r