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Applications of PIXE to mineral characterization

โœ Scribed by Graham C. Wilson; John C. Rucklidge; John L. Campbell; Zdenek Nejedly; William J. Teesdale


Book ID
114165367
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
83 KB
Volume
189
Category
Article
ISSN
0168-583X

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๐Ÿ“œ SIMILAR VOLUMES


Application of PIXE and XRD to the Chara
โœ V. Rodriguezlugo; J. Miranda; S. Viquez; V.M. Castano ๐Ÿ“‚ Article ๐Ÿ“… 1995 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 304 KB

The use of particle induced X-ray emission (PIXE) and X-ray diffraction as complementary techniques for the characterization of mineral samples (clays) is presented. The fundamentals of PIXE experiments, the method for performing quantitative analysis, and the actual results are also discussed. 1905